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Product code: N/A

369-HI-R-M-F-E-H-E Programmable Power Protection Unit

📣Model Number:369-HI-R-M-F-E-H-E

🌍Country of origin: USA France Germany Estonia Norway UK

⌚Delivery date: in stock

🛠After-sales service: brand new with one year warranty

⚙️ Product Category: Module/Controller/Server/Motor/Touch Screen

🕰Warranty: 12 months/365 days

☎️ Please contact me: 15359029662 Ms. Amy Sun

📎Chinese official website: www.dcsplcabb.com

📩Email: geabbamy@gmail.com

💬Whatsapp: +86 15359029662

Detailed content

369-HI-R-M-F-E-H-E

The 30V outputs of the 369-HI-R-M-F-E-H-E can be combined in a variety of configurations, such as in series to produce a 60V output with a maximum current output of 1.5 A, or in parallel to produce a 30V output with an output of 3 A. When configured in this manner, a special display mode will show the actual voltage and current of the combined pair. The power supply also allows the 30V output to be configured to test bipolar circuits or to maintain a user-defined ratio between the two outputs when using trace mode. A variety of features help protect fragile or experimental DUTs from damage during testing, including a programmable voltage maximum that prevents channel voltages from accidentally exceeding preset values.

The 369-HI-R-M-F-E-H-E can be independently set to limit each output channel. In addition, all front panel controls can be locked with a user definable password to prevent inadvertent changes during critical testing. The combination of the new GPIB interface and the existing USB TMC-compatible device port makes it easy to remotely control the power supply from a variety of programming environments. Standard IVI-Com and LabVIEW instrument drivers integrate easily into automated test environments and provide all the tools needed for basic instrument control, data logging and analysis. The programming environment supports a wide range of Tektronix benchtop instruments, allowing access to the functions of multiple instruments through an intuitive software interface to automate an entire test bench or test system.